
As a ‘VMM microscope’, ZEISS O-INSPECT duo covers two essential applications in quality assurance: Precise measurement and high-resolution inspection of large or many small components.
The device has also been specifically developed for applications where a combination of dimensional measurement and inspection is required – including segmentation, stitching and image processing with colour images. Instead of having to acquire both a VMM and a microscope, only one device is needed in quality laboratories, saving space and system costs.
Find out more about further advantages of the multifunctional device for the respective areas by clicking here…











